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EnglishSingle Pole Single Through (SPST) seires micromachined switches have been characterized to check their reliaility under low (¡Ü dBm) and medium 23 dBm) power cycling. Negligible changes of the electrical performance have been recorded in low power regime, while failure or decrease of the electrical response is obtained for the medium power test around 105 cycles. Continuous medium power injection does not result in any failure for the optimized swithch configuration
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| Titolo: | Reliability of RF-MEMS Series Switches under Low and Medium Power Cycling |
| Autori: | |
| Data di pubblicazione: | 2004 |
| Abstract: | Single Pole Single Through (SPST) seires micromachined switches have been characterized to check their reliaility under low (¡Ü dBm) and medium 23 dBm) power cycling. Negligible changes of the electrical performance have been recorded in low power regime, while failure or decrease of the electrical response is obtained for the medium power test around 105 cycles. Continuous medium power injection does not result in any failure for the optimized swithch configuration |
| Handle: | http://hdl.handle.net/11582/2167 |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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http://hdl.handle.net/11582/2167
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