Single Pole Single Through (SPST) seires micromachined switches have been characterized to check their reliaility under low (¡Ü dBm) and medium 23 dBm) power cycling. Negligible changes of the electrical performance have been recorded in low power regime, while failure or decrease of the electrical response is obtained for the medium power test around 105 cycles. Continuous medium power injection does not result in any failure for the optimized swithch configuration

Reliability of RF-MEMS Series Switches under Low and Medium Power Cycling

Margesin, Benno;Giacomozzi, Flavio;
2004

Abstract

Single Pole Single Through (SPST) seires micromachined switches have been characterized to check their reliaility under low (¡Ü dBm) and medium 23 dBm) power cycling. Negligible changes of the electrical performance have been recorded in low power regime, while failure or decrease of the electrical response is obtained for the medium power test around 105 cycles. Continuous medium power injection does not result in any failure for the optimized swithch configuration
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11582/2167
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
social impact