CINECA IRIS Institutional Research Information System
IRIS è l’archivio della produzione scientifica della Fondazione Bruno Kessler.
EnglishLong-term switch reliability is one of the issues that so far prevented the widespread use of RF-MEMS switches. In this paper a detailed analysis of long-term actuation properties of a MEMS capacitive switch is presented, together with a framework for the data interpretation and for failure time prediction.Due to the lack of a solid theoretical background, the modeling function is however not univocal, and this leads to a wide interval of possible lifetimes. However, also in the worst case examined, the predicted device lifetime is at least of the order of several years.
Scheda prodotto non validato
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte di FBK.
| Titolo: | Long-term reliability of RF-MEMS dielectric-less capacitive switches | |
| Autori: | ||
| Data di pubblicazione: | 2013 | |
| Abstract: | Long-term switch reliability is one of the issues that so far prevented the widespread use of RF-MEMS switches. In this paper a detailed analysis of long-term actuation properties of a MEMS capacitive switch is presented, together with a framework for the data interpretation and for failure time prediction.Due to the lack of a solid theoretical background, the modeling function is however not univocal, and this leads to a wide interval of possible lifetimes. However, also in the worst case examined, the predicted device lifetime is at least of the order of several years. | |
| Handle: | http://hdl.handle.net/11582/202215 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11582/202215
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
Copyright © 2021