Long-term switch reliability is one of the issues that so far prevented the widespread use of RF-MEMS switches. In this paper a detailed analysis of long-term actuation properties of a MEMS capacitive switch is presented, together with a framework for the data interpretation and for failure time prediction.Due to the lack of a solid theoretical background, the modeling function is however not univocal, and this leads to a wide interval of possible lifetimes. However, also in the worst case examined, the predicted device lifetime is at least of the order of several years.



Titolo: Long-term reliability of RF-MEMS dielectric-less capacitive switches
Autori: 
Mulloni, Viviana
Giacomozzi, Flavio
Resta, Giuseppe
Margesin, Benno
Data di pubblicazione: 2013
Abstract: Long-term switch reliability is one of the issues that so far prevented the widespread use of RF-MEMS switches. In this paper a detailed analysis of long-term actuation properties of a MEMS capacitive switch is presented, together with a framework for the data interpretation and for failure time prediction.Due to the lack of a solid theoretical background, the modeling function is however not univocal, and this leads to a wide interval of possible lifetimes. However, also in the worst case examined, the predicted device lifetime is at least of the order of several years.
Handle: http://hdl.handle.net/11582/202215
Appare nelle tipologie:4.1 Contributo in Atti di convegno

File in questo prodotto:
Non ci sono file associati a questo prodotto.
Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11582/202215
  • Citazioni
  • ND

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
 
 
 
Powered by IRIS-about IRIS-Utilizzo dei cookie
Logo CINECA  Copyright © 2020