CINECA IRIS Institutional Research Information System
IRIS è l’archivio della produzione scientifica della Fondazione Bruno Kessler.
EnglishWe report on some recent results from our research activity on silicon microstrip detectors. In particular, a test-chip aimed at the optimization of the dielectric film of coupling capacitors for AC-coupled microstrip detectors was fabricated and electrically characterized. Breakdown behaviour of coupling capacitors employing different dielectrics is presented and discussed. The impact of the different technological options adopted on some important parameters characterizing the detector performance, such as diode leakage current and breakdown voltage, is also analysed.
Scheda prodotto non validato
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte di FBK.
| Titolo: | Analysis of the Breakdown Behaviour of Stacked Dielectric Capacitors for AC-coupled Silicon Microstrip Detectors | |
| Autori: | ||
| Data di pubblicazione: | 1997 | |
| Abstract: | We report on some recent results from our research activity on silicon microstrip detectors. In particular, a test-chip aimed at the optimization of the dielectric film of coupling capacitors for AC-coupled microstrip detectors was fabricated and electrically characterized. Breakdown behaviour of coupling capacitors employing different dielectrics is presented and discussed. The impact of the different technological options adopted on some important parameters characterizing the detector performance, such as diode leakage current and breakdown voltage, is also analysed. | |
| Handle: | http://hdl.handle.net/11582/1428 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11582/1428
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
Copyright © 2021