An incremental ADC for Wheatstone CMOS stress sensor systems is described. A switched-capacitors integrator without switches toward virtual ground avoids spur signals, clock feed-through, residual oset and glitches. The circuit, fabricated in a 0.35-um CMOS technology, consumes 42uW at 500-kHz clock and 2.8-V supply. Low speed chopping cancels offset and limits the 1/f noise contribution. The signal-to-noise ratio with measures lasting 2^20 periods is 114 dB at plus-minus 100 mV full-scale range. The active area is 0.32 mm^2.
An Incremental ADC Sensor Interface with Input Switch-Less Integrator Featuring 220-nVRMS Resolution with 30-mV Input Range
Stoppa, David;
2012-01-01
Abstract
An incremental ADC for Wheatstone CMOS stress sensor systems is described. A switched-capacitors integrator without switches toward virtual ground avoids spur signals, clock feed-through, residual oset and glitches. The circuit, fabricated in a 0.35-um CMOS technology, consumes 42uW at 500-kHz clock and 2.8-V supply. Low speed chopping cancels offset and limits the 1/f noise contribution. The signal-to-noise ratio with measures lasting 2^20 periods is 114 dB at plus-minus 100 mV full-scale range. The active area is 0.32 mm^2.File in questo prodotto:
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