Rebib, Farida
Rebib, Farida
Mostra
records
Risultati 1 - 3 di 3 (tempo di esecuzione: 0.006 secondi).
Effect of composition inhomogeneity in a-SiOxNy thin films on their optical properties
2009-01-01 Rebib, Farida; E., Tomasella; Micheli, Victor; C., Eypert; J., Cellier; Bensaada Laidani, Nadhira
Influence of Substrate Biasing on the Structural and Electrical Properties of Sputtered Zirconia Thin Films
2009-01-01 Rebib, Farida; A., Bousquet; E., Tomasella; Micheli, Victor; Gottardi, Gloria; Bensaada Laidani, Nadhira
Investigation of structural and optical properties of sputtered Zirconia thin films
2008-01-01 Rebib, Farida; Bensaada Laidani, Nadhira; Gottardi, Gloria; Micheli, Victor; Bartali, Ruben; Jestin, Yoann; E., Tomasella; Ferrari, Maurizio; L., Thomas
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Effect of composition inhomogeneity in a-SiOxNy thin films on their optical properties | 1-gen-2009 | Rebib, Farida; E., Tomasella; Micheli, Victor; C., Eypert; J., Cellier; Bensaada Laidani, Nadhira | |
| Influence of Substrate Biasing on the Structural and Electrical Properties of Sputtered Zirconia Thin Films | 1-gen-2009 | Rebib, Farida; A., Bousquet; E., Tomasella; Micheli, Victor; Gottardi, Gloria; Bensaada Laidani, Nadhira | |
| Investigation of structural and optical properties of sputtered Zirconia thin films | 1-gen-2008 | Rebib, Farida; Bensaada Laidani, Nadhira; Gottardi, Gloria; Micheli, Victor; Bartali, Ruben; Jestin, Yoann; E., Tomasella; Ferrari, Maurizio; L., Thomas |