The permanent degradation introduced in the main electrical parameters of a newly developed European optocoupler type is described, as a function of proton fluences and Co-60 total ionizing dose. Optoi’s devices assembled in Leadless Chip Carrier packages, coded OIER10 are being developed in the framework of an ECI project for ESA, aimed at the ESCC evaluation of Optoi optocouplers. The first analyses of the recent irradiation results show a good behavior of the parts under proton and gamma irradiation.

Recent Proton and Co60 Radiation Test Data from a newly developed European Optocoupler source for space application

Ress, Cristina;Collini, Amos;Ficorella, Francesco;
2013-01-01

Abstract

The permanent degradation introduced in the main electrical parameters of a newly developed European optocoupler type is described, as a function of proton fluences and Co-60 total ionizing dose. Optoi’s devices assembled in Leadless Chip Carrier packages, coded OIER10 are being developed in the framework of an ECI project for ESA, aimed at the ESCC evaluation of Optoi optocouplers. The first analyses of the recent irradiation results show a good behavior of the parts under proton and gamma irradiation.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/207015
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
social impact