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Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 1-gen-2006 Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 1-gen-2006 Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J., van den Berg; M., Werner
Junction Stability of B Doped Layers in SOI Formed with Optimized Vacancy Engineering Implants 1-gen-2006 A. J., Smith; N. E. B., Cowern; B., Colombeau; R., Gwilliam; B. J., Sealy; E. J. H., Collart; Gennaro, Salvatore; Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario
Analytical methodology development for SRO chemical physical characterization 1-gen-2006 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis
Correlation between silicon-nitride film stress and composition: XPS and SIMS analyses 1-gen-2006 Vanzetti, Lia Emanuela; Barozzi, Mario; Giubertoni, Damiano; C., Kompocholis; Bagolini, Alvise; Bellutti, Pierluigi
Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation 1-gen-2007 Selcuk, Yerci; I., Yildiz; M., Kulacki; U., Serincan; Barozzi, Mario; Bersani, Massimo
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 1-gen-2007 Barozzi, Mario; Vanzetti, Lia Emanuela; Iacob, Erica; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis; Ghulinyan, Mher; Bellutti, Pierluigi
Analytical methodology development for Silicon rich oxide chemical physical characterization 1-gen-2007 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 1-gen-2007 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 1-gen-2007 Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 1-gen-2008 Barozzi, Mario; Vanzetti, Lia Emanuela; Iacob, Erica; Bersani, Massimo; A., Anderle; Pucker, Georg; Constantine, Kompocholis; Ghulinyan, Mher; Bellutti, Pierluigi
Phase separation and layer mixing in SiO2/SiOx superlattices 1-gen-2008 Pucker, Georg; Ghulinyan, Mher; Barozzi, Mario; Vanzetti, Lia Emanuela; Picciotto, Antonino; M., Wang; Bersani, Massimo
Secondary ion mass spectrometry analysis applications on semiconductor materials 1-gen-2008 Bersani, Massimo; Giubertoni, Damiano; Gennaro, Salvatore; Barozzi, Mario; Canteri, Roberto; Vanzetti, Lia Emanuela; Pepponi, Giancarlo; Anderle, Mariano
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 1-gen-2008 Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi
Structural analyses of thermal annealed SRO/SiO2 superlattices 1-gen-2010 Vanzetti, Lia Emanuela; Pucker, Georg; S., Milita; Barozzi, Mario; Ghulinyan, Mher; Bersani, Massimo
Visita ispettiva annuale di sorveglianza Accredia 1-gen-2010 Iacob, Erica; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Vanzetti, Lia Emanuela
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 1-gen-2011 Barozzi, Mario; Iacob, Erica; Jaap Van Den, Berg; Mike, Reading; Christoph, Adelmann; Hilde, Tielens; Bersani, Massimo; Mihaela, Popovici
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si 1-gen-2011 I., Mohacsi; P., Petrik; M., Fried; T., Lohner; J. A., van den Berg; M. A., Reading; Giubertoni, Damiano; Barozzi, Mario; A., Parisini
High performance n+/p and p+/n germanium diodes at low-temperature activation annealing 1-gen-2011 V., Ioannou Sougleridis; S. F., Galata; E., Golias; T., Speliotis; A., Dimoulas; Giubertoni, Damiano; Gennaro, Salvatore; Barozzi, Mario
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 1-gen-2011 Iacob, Erica; Barozzi, Mario; Demenev, Evgeny; Gennaro, Salvatore; Giubertoni, Damiano; Bersani, Massimo
Mostrati risultati da 61 a 80 di 120
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