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Adaptation of a commercial total reflection X-ray fluorescence system for wafer surface analysis equipped with a new generation of silicon drift detector 1-gen-2006 S., Pahlke; Meirer, Florian; P., Wobrauschek; C., Streli; G., Peter Westphal; C., Mantler
Application of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap 1-gen-2007 Meirer, Florian; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Viktor Gabor, Mihucz; Gyula, Zaray; Viktoria, Czech; Jose, Broekaert; Ursula, Fittschen; Gerald, Falkenberg
Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surface 1-gen-2008 Meirer, Florian; Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; M., Zaitz; C., Horntrich; Gerald, Falkenberg
Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenic 1-gen-2008 Meirer, Florian; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; P., Kregsamer; Norbart, Zoeger; Gerald, Falkenberg
Characterization of atmospheric aerosols using SR-TXRF and Fe K-edge TXRF-XANES 1-gen-2008 Ursula, Fittschen; Meirer, Florian; Christina, Streli; Peter, Wobrauschek; Julian, Thiele; Gerald, Falkenberg; Pepponi, Giancarlo
Synchrotron radiation induced TXRF- a critical review 1-gen-2008 Christina, Streli; Peter, Wobrauschek; Meirer, Florian; Pepponi, Giancarlo
Total Reflection X-ray Fluorescence attachment module modified for analysis in vacuum 1-gen-2008 P., Wobrauschek; C., Streli; P., Kregsamer; Meirer, Florian; C., Jokubonis; A., Markowicz; D., Wegrzynek; E., Chinea Cano
Trace element analysis of airport related aerosols using SR-TXRF 1-gen-2008 Veronika, Groma; János, Osán; Szabina, Török; Meirer, Florian; Christina, Streli; Peter, Wobrauschek; Gerald, Falkenberg
Characterization of junction activation and deactivation using non-equilibrium annealing: Solid phase epitaxy, spike annealing, laser annealing 1-gen-2009 Bersani, Massimo; Pepponi, Giancarlo; Giubertoni, Damiano; Gennaro, Salvatore; Mehmet, Sahiner; Stephen, Kelty; Max, Kah; K. J., Kirkby; Roisin, Doherty; Majeed, Foad; Meirer, Florian; Christina, Streli; Joseph, Woicik; P., Pianetta
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; Burkhard, Beckhoff; P., Hoenicke; Gennaro, Salvatore; Meirer, Florian; Deieter, Ingerle; Georg, Steinhauser; Miklos, Fried; P., Petrik; A., Parisini; M., Reading; Christina, Streli; Jaap van den, Berg; Bersani, Massimo
Complementary metrology within a European joint laboratory 1-gen-2009 A., Nutsch; B., Beckhoff; R., Altmann; Jaap van den, Berg; Giubertoni, Damiano; P., Hoenicke; Bersani, Massimo; A., Leibold; Meirer, Florian; M., Mueller; Pepponi, Giancarlo; M., Otto; P., Petrik; M., Reading; L., Pfitzner; H., Ryssel
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium. 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; B., Beckhoff; P., Hoenicke; Gennaro, Salvatore; Meirer, Florian; D., Ingerle; G., Steinhauser; M., Fried; P., Petrik; A., Parisini; M. A., Reading; C., Streli; J. A., van den Berg; Bersani, Massimo
Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces 1-gen-2009 Meirer, Florian; Pepponi, Giancarlo; C., Streli; P., Wobrauschek; N., Zoeger
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon 1-gen-2009 Pepponi, Giancarlo; Meirer, Florian; Giubertoni, Damiano; D., Ingerle; G., Steinhauser; C., Streli; P., Hoenicke; B., Beckhoff; Bersani, Massimo
Developments in TXRF analysis 1-gen-2009 C., Streli; Meirer, Florian; P., Wobrauschek; Pepponi, Giancarlo
Multi-technique characterization of arsenic and boron ultra low energy implants in silicon within the ANNA consortium. 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; B., Beckhoff; P., Hoenicke; Gennaro, Salvatore; Meirer, Florian; D., Ingerle; G., Steinhauser; M., Fried; P., Petrik; A., Parisini; M. A., Reading; C., Streli; J. A., van den Berg; Bersani, Massimo
Deactivation of sub-melt laser annealed arsenic ultra shallow junctions in silicon during subsequent thermal treatment 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; M. A., Sahiner; S. P., Kelty; M., Kah; K. J., Kirkby; Meirer, Florian; Gennaro, Salvatore; R., Doherty; M. A., Foad; J. C., Woicik; C., Streli; Bersani, Massimo; P., Pianetta
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon. 1-gen-2009 Pepponi, Giancarlo; Meirer, Florian; Giubertoni, Damiano; D., Ingerle; G., Steinhauser; C., Streli; P., Hoenicke; B., Beckhoff; Bersani, Massimo
TXRF using laboratory sources and Synchrotron radiation 1-gen-2009 C., Streli; P., Wobrauschek; Meirer, Florian; Pepponi, Giancarlo
X-Ray Analysis using Synchrotron Radiation 1-gen-2009 C., Streli; Meirer, Florian; Peter, Wobrauschek; Norbert, Zoeger; Pepponi, Giancarlo
Mostrati risultati da 1 a 20 di 65
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