Sfoglia per Autore
Energy dispersion of X-ray continua in the energy range 8 keV to 16 keV by refraction on Si wafers,
2001-01-01 Horst, Ebel; Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek
Synchrotron radiation total reflection X-ray fluorescence and energy dispersive X-ray fluorescence analysis on AP1(TM) films applied to the analysis of trace elements in metal alloys for the construction of nuclear reactor core components: a comparison,
2001-01-01 Pepponi, Giancarlo; Peter, Wobrauschek; Ferenc, Hegedus; Christina, Streli; N., Zoger; Christoph, Jokubonis; Gerald, Falkenberg; H., Grimmer
Synchrotron radiation-induced TXRF of reactor steel samples,
2001-01-01 Pepponi, Giancarlo; Peter, Wobrauschek; Christina, Streli; N., Zoger; Ferenc, Hegedus
Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL ¯¯ comparison of excitation geometries and conditions,
2001-01-01 Christina, Streli; Peter, Wobrauschek; Peter, Kregsamer; Pepponi, Giancarlo; P., Pianetta; Siegfried, Pahlke; Laszlo, Fabry
Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II,
2001-01-01 Burkhard, Beckhoff; Rolf, Fliegauf; Gerhard, Ulm; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Laszlo, Fabry; Siegfried, Pahlke
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali
2002-01-01 P., Gottardini; Lazzeri, Paolo; Pepponi, Giancarlo; Fabiana, Cristofolini; Eva, Carli
Functional and Chemical Characterization of pollen for environmental quality assessment
2002-01-01 Lazzeri, Paolo; Elena, Gottardini; Pepponi, Giancarlo; Eva, Carli; Fabiana, Cristofolini; Coghe, Nicoletta
SR-XRF investigation in human bone,
2002-01-01 Peter, Wobrauschek; Pepponi, Giancarlo; Christina, Streli; Christoph, Jokubonis; Gerald, Falkenberg; Wolf, Osterode
Total Reflection X-ray Fluorescence Analysis (TXRF) using the high flux SAXS camera,
2002-01-01 Peter, Wobrauschek; Christina, Streli; Pepponi, Giancarlo; Alexander, Bergmann; Otto, Glatter
Caratterizzazione chimica di pollini tramite imaging ToF-SIMS e TXRF per indagini ambientali
2002-01-01 Eva, Carli; Lazzeri, Paolo; Elena, Gottardini; Pepponi, Giancarlo; Fabiana, Cristofolini; Coghe, Nicoletta
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers,
2003-01-01 Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; N., Zoger; P., Pianetta; Katharina, Baur; Siegfried, Pahlke; Laszlo, Fabry; Claus, Mantler; Birgid, Kanngiesser; Wolfgang, Malzer
Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples,
2003-01-01 Gerald, Falkenberg; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek
Comparison of synchrotron radiation total reflection X-ray fluorescence excitation–detection geometries for samples with differing matrices
2003-01-01 Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Shokufeh, Zamini; N., Zoger; Gerald, Falkenberg
Analysis of organic contaminants on Si wafers with TXRF-NEXAFS
2003-01-01 Pepponi, Giancarlo; Thomas, Ehmann; Christina, Streli; Laszlo, Fabry; Siegfried, Pahlke; Peter, Wobrauschek; Burkhard, Beckhoff; Gerhard, Ulm
TXRF analysis of low Z elements and TXRF-NEXAFS speciation of organic contaminants on silicon wafer surfaces excited by monochromatized undulator radiation;
2003-01-01 Burkhard, Beckhoff; Rolf, Fliegauf; Gerhard, Ulm; Jan, Weser; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Thomas, Ehmann; Laszlo, Fabry; Siegfried, Pahlke; Birgid, Kanngiesser; Wolfgang, Malzer
Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II
2003-01-01 Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; B., Beckhoff; G., Ulm; Siegfried, Pahlke; Laszlo, Fably; Thomas, Ehmann; Birgid, Kanngiesser; Wolfgang, Malzer; W., Jark
Vitalità e caratterizzazione chimico-fisica dei pollini come indicatori di inquinamento atmosferico
2003-01-01 Elena, Gottardini; Lazzeri, Paolo; Pepponi, Giancarlo; Fabiana, Cristofolini; Eva, Carli
Non destructive dose determination and depth profiling of arsenic ultrashallow junctions with total reflection X-ray fluorescence analysis compared to dynamic secondary ion mass spectrometry
2004-01-01 Pepponi, Giancarlo; C., Streli; P., Wobrauschek; N., Zoeger; K., Leuning; P., Pianetta; Giubertoni, Damiano; Barozzi, Mario; Bersani, Massimo
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution
2004-01-01 Pepponi, Giancarlo; Lazzeri, Paolo; N., Coghe; Bersani, Massimo; E., Gottardini; F., Cristofolini; G., Clauser; A., Torboli
A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis
2004-01-01 C., Streli; P., Wobrauschek; Pepponi, Giancarlo; N., Zoeger
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Energy dispersion of X-ray continua in the energy range 8 keV to 16 keV by refraction on Si wafers, | 1-gen-2001 | Horst, Ebel; Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek | |
Synchrotron radiation total reflection X-ray fluorescence and energy dispersive X-ray fluorescence analysis on AP1(TM) films applied to the analysis of trace elements in metal alloys for the construction of nuclear reactor core components: a comparison, | 1-gen-2001 | Pepponi, Giancarlo; Peter, Wobrauschek; Ferenc, Hegedus; Christina, Streli; N., Zoger; Christoph, Jokubonis; Gerald, Falkenberg; H., Grimmer | |
Synchrotron radiation-induced TXRF of reactor steel samples, | 1-gen-2001 | Pepponi, Giancarlo; Peter, Wobrauschek; Christina, Streli; N., Zoger; Ferenc, Hegedus | |
Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL ¯¯ comparison of excitation geometries and conditions, | 1-gen-2001 | Christina, Streli; Peter, Wobrauschek; Peter, Kregsamer; Pepponi, Giancarlo; P., Pianetta; Siegfried, Pahlke; Laszlo, Fabry | |
Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II, | 1-gen-2001 | Burkhard, Beckhoff; Rolf, Fliegauf; Gerhard, Ulm; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Laszlo, Fabry; Siegfried, Pahlke | |
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali | 1-gen-2002 | P., Gottardini; Lazzeri, Paolo; Pepponi, Giancarlo; Fabiana, Cristofolini; Eva, Carli | |
Functional and Chemical Characterization of pollen for environmental quality assessment | 1-gen-2002 | Lazzeri, Paolo; Elena, Gottardini; Pepponi, Giancarlo; Eva, Carli; Fabiana, Cristofolini; Coghe, Nicoletta | |
SR-XRF investigation in human bone, | 1-gen-2002 | Peter, Wobrauschek; Pepponi, Giancarlo; Christina, Streli; Christoph, Jokubonis; Gerald, Falkenberg; Wolf, Osterode | |
Total Reflection X-ray Fluorescence Analysis (TXRF) using the high flux SAXS camera, | 1-gen-2002 | Peter, Wobrauschek; Christina, Streli; Pepponi, Giancarlo; Alexander, Bergmann; Otto, Glatter | |
Caratterizzazione chimica di pollini tramite imaging ToF-SIMS e TXRF per indagini ambientali | 1-gen-2002 | Eva, Carli; Lazzeri, Paolo; Elena, Gottardini; Pepponi, Giancarlo; Fabiana, Cristofolini; Coghe, Nicoletta | |
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers, | 1-gen-2003 | Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; N., Zoger; P., Pianetta; Katharina, Baur; Siegfried, Pahlke; Laszlo, Fabry; Claus, Mantler; Birgid, Kanngiesser; Wolfgang, Malzer | |
Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples, | 1-gen-2003 | Gerald, Falkenberg; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek | |
Comparison of synchrotron radiation total reflection X-ray fluorescence excitation–detection geometries for samples with differing matrices | 1-gen-2003 | Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Shokufeh, Zamini; N., Zoger; Gerald, Falkenberg | |
Analysis of organic contaminants on Si wafers with TXRF-NEXAFS | 1-gen-2003 | Pepponi, Giancarlo; Thomas, Ehmann; Christina, Streli; Laszlo, Fabry; Siegfried, Pahlke; Peter, Wobrauschek; Burkhard, Beckhoff; Gerhard, Ulm | |
TXRF analysis of low Z elements and TXRF-NEXAFS speciation of organic contaminants on silicon wafer surfaces excited by monochromatized undulator radiation; | 1-gen-2003 | Burkhard, Beckhoff; Rolf, Fliegauf; Gerhard, Ulm; Jan, Weser; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Thomas, Ehmann; Laszlo, Fabry; Siegfried, Pahlke; Birgid, Kanngiesser; Wolfgang, Malzer | |
Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II | 1-gen-2003 | Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; B., Beckhoff; G., Ulm; Siegfried, Pahlke; Laszlo, Fably; Thomas, Ehmann; Birgid, Kanngiesser; Wolfgang, Malzer; W., Jark | |
Vitalità e caratterizzazione chimico-fisica dei pollini come indicatori di inquinamento atmosferico | 1-gen-2003 | Elena, Gottardini; Lazzeri, Paolo; Pepponi, Giancarlo; Fabiana, Cristofolini; Eva, Carli | |
Non destructive dose determination and depth profiling of arsenic ultrashallow junctions with total reflection X-ray fluorescence analysis compared to dynamic secondary ion mass spectrometry | 1-gen-2004 | Pepponi, Giancarlo; C., Streli; P., Wobrauschek; N., Zoeger; K., Leuning; P., Pianetta; Giubertoni, Damiano; Barozzi, Mario; Bersani, Massimo | |
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution | 1-gen-2004 | Pepponi, Giancarlo; Lazzeri, Paolo; N., Coghe; Bersani, Massimo; E., Gottardini; F., Cristofolini; G., Clauser; A., Torboli | |
A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis | 1-gen-2004 | C., Streli; P., Wobrauschek; Pepponi, Giancarlo; N., Zoeger |
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