Sfoglia per Rivista PHYSICA STATUS SOLIDI. C
Cr induced nanocrystallization of a-Si thin films: its mechanism
2012-01-01 Ahamad Mohiddon, M. d.; K., Lakshun Naidu; G., Dalba; Rocca, Francesco; M., Ghanashyam Krishna
Diffusion of implanted nitrogen in germanium.
2013-01-01 Skarlatos, D.; Barozzi, Mario; Bersani, Massimo; Vouroutzis, N. Z.; Ioannou Sougleridis, V.
Morphologic, structural, and optical characterization of sol-gel derived TiO2 thin films for memristive devices
2015-01-01 Prusakova, Valentina; Armellini, Cristina; Carpentiero, Alessandro; Chiappini, Andrea; Collini, Cristian; Dirè, Sandra; Ferrari, Maurizio; Lorenzelli, Leandro; Nardello, Marco; Normani, Simone; Vaccari, Alessandro; Chiasera, Alessandro
Observation of point defect injection from electrical de-activation of arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing
2014-01-01 Demenev, Evgeny; Meirer, Florian; Essa, Z.; Giubertoni, Damiano; Cristiano, F.; Pepponi, Giancarlo; Gennaro, Salvatore; Bersani, Massimo; Foad, M. A.
On an improved boron segregation calibration from a particularly sensitive power MOS process
2014-01-01 Koffel, S.; Burenkov, A.; Sekowski, M.; Pichler, P.; Giubertoni, Damiano; Bersani, Massimo; Knaipp, M.; Wachmann, E.; Schrems, M.; Yamamoto, Y.; Bolze, D.
Surface evolution of very high dose arsenic implants in silicon formed by plasma immersion ion implantation – a long term study
2014-01-01 Meirer, Florian; Demenev, Evgeny; Giubertoni, Damiano; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Fedrizzi, Michele; Pepponi, Giancarlo; Steinhauser, G.; Vishwanath, V.; Foad, M. A.; Bersani, Massimo
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Cr induced nanocrystallization of a-Si thin films: its mechanism | 1-gen-2012 | Ahamad Mohiddon, M. d.; K., Lakshun Naidu; G., Dalba; Rocca, Francesco; M., Ghanashyam Krishna | |
| Diffusion of implanted nitrogen in germanium. | 1-gen-2013 | Skarlatos, D.; Barozzi, Mario; Bersani, Massimo; Vouroutzis, N. Z.; Ioannou Sougleridis, V. | |
| Morphologic, structural, and optical characterization of sol-gel derived TiO2 thin films for memristive devices | 1-gen-2015 | Prusakova, Valentina; Armellini, Cristina; Carpentiero, Alessandro; Chiappini, Andrea; Collini, Cristian; Dirè, Sandra; Ferrari, Maurizio; Lorenzelli, Leandro; Nardello, Marco; Normani, Simone; Vaccari, Alessandro; Chiasera, Alessandro | |
| Observation of point defect injection from electrical de-activation of arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing | 1-gen-2014 | Demenev, Evgeny; Meirer, Florian; Essa, Z.; Giubertoni, Damiano; Cristiano, F.; Pepponi, Giancarlo; Gennaro, Salvatore; Bersani, Massimo; Foad, M. A. | |
| On an improved boron segregation calibration from a particularly sensitive power MOS process | 1-gen-2014 | Koffel, S.; Burenkov, A.; Sekowski, M.; Pichler, P.; Giubertoni, Damiano; Bersani, Massimo; Knaipp, M.; Wachmann, E.; Schrems, M.; Yamamoto, Y.; Bolze, D. | |
| Surface evolution of very high dose arsenic implants in silicon formed by plasma immersion ion implantation – a long term study | 1-gen-2014 | Meirer, Florian; Demenev, Evgeny; Giubertoni, Damiano; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Fedrizzi, Michele; Pepponi, Giancarlo; Steinhauser, G.; Vishwanath, V.; Foad, M. A.; Bersani, Massimo |
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